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SFS-EN 62047-12:en – Semiconductor devices – Micro-electromechanical devices – Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures

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IEC 62047-12:2011 specifies a method for bending fatigue testing using resonant vibration of microscale mechanical structures of MEMS (micro-electromechanical systems) and micromachines. This standard applies to vibrating structures ranging in size from 10 μm to 1 000 μm in the plane direct ...
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